Multiple cracks of a thin film on a ductile substrate

Ming Hao Zhao; Ran Fu; Tong Yi Zhang

doi:10.1557/proc-695-l9.3.1

Multiple cracks of a thin film on a ductile substrate

Ming Hao Zhao
, Ran Fu
, Tong Yi Zhang^*

^*Corresponding author for this work

Department of Mechanical and Aerospace Engineering

Research output: Contribution to journal › Conference article published in journal › peer-review

2 Citations (Scopus)

Abstract

The present work proposes a Dugdale type model to theoretically predict the multiple cracks of a residually tensile stressed thin film on a ductile substrate. The results show that there exists a critical value, R_c, of the cracking resistance number, R. When R < R_c, the film cracks and the normalized crack spacing is determined by cracking resistance number and the stress ratio of the residual stress to the yield strength of the substrate.

Original language	English
Pages (from-to)	391-396
Number of pages	6
Journal	Materials Research Society Symposium - Proceedings
Volume	695
DOIs	https://doi.org/10.1557/proc-695-l9.3.1
Publication status	Published - 2002
Event	Thin Films: Stresses and Mechanical Properties IX - Boston, MA, United States Duration: 26 Nov 2001 → 30 Nov 2001

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10.1557/proc-695-l9.3.1

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title = "Multiple cracks of a thin film on a ductile substrate",

abstract = "The present work proposes a Dugdale type model to theoretically predict the multiple cracks of a residually tensile stressed thin film on a ductile substrate. The results show that there exists a critical value, Rc, of the cracking resistance number, R. When R < Rc, the film cracks and the normalized crack spacing is determined by cracking resistance number and the stress ratio of the residual stress to the yield strength of the substrate.",

author = "Zhao, \{Ming Hao\} and Ran Fu and Zhang, \{Tong Yi\}",

year = "2002",

doi = "10.1557/proc-695-l9.3.1",

language = "English",

volume = "695",

pages = "391--396",

journal = "Materials Research Society Symposium - Proceedings",

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note = "Thin Films: Stresses and Mechanical Properties IX ; Conference date: 26-11-2001 Through 30-11-2001",

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TY - JOUR

T1 - Multiple cracks of a thin film on a ductile substrate

AU - Zhao, Ming Hao

AU - Fu, Ran

AU - Zhang, Tong Yi

PY - 2002

Y1 - 2002

N2 - The present work proposes a Dugdale type model to theoretically predict the multiple cracks of a residually tensile stressed thin film on a ductile substrate. The results show that there exists a critical value, Rc, of the cracking resistance number, R. When R < Rc, the film cracks and the normalized crack spacing is determined by cracking resistance number and the stress ratio of the residual stress to the yield strength of the substrate.

AB - The present work proposes a Dugdale type model to theoretically predict the multiple cracks of a residually tensile stressed thin film on a ductile substrate. The results show that there exists a critical value, Rc, of the cracking resistance number, R. When R < Rc, the film cracks and the normalized crack spacing is determined by cracking resistance number and the stress ratio of the residual stress to the yield strength of the substrate.

UR - https://www.scopus.com/pages/publications/0036350074

U2 - 10.1557/proc-695-l9.3.1

DO - 10.1557/proc-695-l9.3.1

M3 - Conference article published in journal

AN - SCOPUS:0036350074

SN - 0272-9172

VL - 695

SP - 391

EP - 396

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Thin Films: Stresses and Mechanical Properties IX

Y2 - 26 November 2001 through 30 November 2001

ER -

Multiple cracks of a thin film on a ductile substrate

Abstract

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