Novel current-voltage characteristics of an InP-based resonant-tunneling high electron mobility transistor and their circuit applications

Kevin J. Chen*, Koichi Maezawa, Masafumi Yamamoto

*Corresponding author for this work

Research output: Contribution to journalConference article published in journalpeer-review

8 Citations (Scopus)

Abstract

We report novel current-voltage characteristics in an InP-based resonant-tunneling high electron mobility transistor (RTHEMT). The RTHEMT incorporates a resonant-tunneling diode structure into the source region of a HEMT. A near-flat valley current is obtained in the current-voltage characteristics. This unique feature leads to the observation of negative transconductance throughout a wide range of source-drain bias. Using a simple circuit that combines an RTHEMT with a resistor load, we demonstrate frequency multipliers (both doubler and tripler) and a three-valued logic inverse literal gate.

Original languageEnglish
Pages (from-to)379-382
Number of pages4
JournalTechnical Digest - International Electron Devices Meeting, IEDM
Publication statusPublished - 1995
Externally publishedYes
EventProceedings of the 1995 International Electron Devices Meeting, IEDM'95 - Washington, DC, USA
Duration: 10 Dec 199513 Dec 1995

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