TY - JOUR
T1 - Numerical simulation of ZnSe/GaAs interface reflectance difference spectroscopy
AU - Kwok, Tat Kun
AU - Yang, Z.
PY - 1996/10/15
Y1 - 1996/10/15
N2 - A numerical method based on the matrices established by Yen [Optical Waves in Layered Media (Wiley, New York, 1988)] is developed to simulate the non-normal incidence reflectance difference spectroscopy (RDS) spectra of biaxial anisoctropic (εx≠εy≠εz) multilayer systems. The main features of me RDS spectra obtained from the biaxial anisotropic ZnSe/GaAs interface are reproduced by the numerical method. It has demonstrated that in the cases of near-normal incidence and when the anisotropy within the layer plane (in-plane anisotropy) is small (εx-εy≪εx) a RDS spectrum can be separated into two spectra, namely, the in-plane anisotropic spectrum and the off-plane anisotropic spectrum. The reflectance of the s wave and the p wave can be calculated separately when the in-plane principal axes are at certain orientations, making it possible to obtain the anisotropic dielectric tensor directly from the measured spectra.
AB - A numerical method based on the matrices established by Yen [Optical Waves in Layered Media (Wiley, New York, 1988)] is developed to simulate the non-normal incidence reflectance difference spectroscopy (RDS) spectra of biaxial anisoctropic (εx≠εy≠εz) multilayer systems. The main features of me RDS spectra obtained from the biaxial anisotropic ZnSe/GaAs interface are reproduced by the numerical method. It has demonstrated that in the cases of near-normal incidence and when the anisotropy within the layer plane (in-plane anisotropy) is small (εx-εy≪εx) a RDS spectrum can be separated into two spectra, namely, the in-plane anisotropic spectrum and the off-plane anisotropic spectrum. The reflectance of the s wave and the p wave can be calculated separately when the in-plane principal axes are at certain orientations, making it possible to obtain the anisotropic dielectric tensor directly from the measured spectra.
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:A1996VM27200060
UR - https://openalex.org/W1982394043
UR - https://www.scopus.com/pages/publications/0041590207
U2 - 10.1063/1.363444
DO - 10.1063/1.363444
M3 - Journal Article
SN - 0021-8979
VL - 80
SP - 4621
EP - 4625
JO - Journal of Applied Physics
JF - Journal of Applied Physics
IS - 8
ER -