On the Formulation of Self-Heating Models for Circuit Simulation

Lining Zhang*, Debin Song, Ying Xiao, Xinnan Lin, Mansun Chan

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

Abstract

Different approaches to implement self-heating effects in a compact model are evaluated. The traditional approach using a subcircuit with the addition of an internal node can lead to significant increase in the simulation time. In contrast, by directly solving self-heating equations, the internal node is eliminated in the circuit Jacobian matrix. The resulting simulation time can be shortened in principle up to 60% or more without sacrificing the accuracy. The accuracy and time for self-heating simulations formulated using different approaches are compared in this paper to study their tradeoff. In addition, a generic approach to eliminate the need for internal nodes is proposed and demonstrated using the non-quasi-static effect model.

Original languageEnglish
Pages (from-to)291-297
Number of pages7
JournalIEEE Journal of the Electron Devices Society
Volume6
Issue number1
DOIs
Publication statusPublished - 5 Feb 2018

Bibliographical note

Publisher Copyright:
© 2013 IEEE.

Keywords

  • FinFETs circuits
  • Self-heating
  • circuit self-heating
  • internal-node free

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