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Optical probing technique for inhomogeneous superconducting films

  • C. C. Chi*
  • , M. M.T. Loy
  • , D. C. Cronemeyer
  • *Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

Abstract

We report a nondestructive optical probing technique for superconducting films, by which a cross-sectional gradient of the local transition temperature Tc and a two-dimensional map of the local critical current I c of an Al film were obtained. The two-dimensional map clearly shows a variety of defects of the Al film. Some of them can be correlated to visible pinholes.

Original languageEnglish
Pages (from-to)437-439
Number of pages3
JournalApplied Physics Letters
Volume40
Issue number5
DOIs
Publication statusPublished - 1982
Externally publishedYes

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