Optical probing technique for inhomogeneous superconducting films

C. C. Chi*, M. M.T. Loy, D. C. Cronemeyer

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

23 Citations (Scopus)

Abstract

We report a nondestructive optical probing technique for superconducting films, by which a cross-sectional gradient of the local transition temperature Tc and a two-dimensional map of the local critical current I c of an Al film were obtained. The two-dimensional map clearly shows a variety of defects of the Al film. Some of them can be correlated to visible pinholes.

Original languageEnglish
Pages (from-to)437-439
Number of pages3
JournalApplied Physics Letters
Volume40
Issue number5
DOIs
Publication statusPublished - 1982
Externally publishedYes

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