Production Scheduling Algorithms for a Semiconductor Test Facility

The objective of this study is to develop production scheduling algorithms for semiconductor test operations. The operations in the facility under study are characterized by a broad product mix, variable lot sizes and yields, long and variable setup times, and limited test equipment capacity. The approach presented in this paper starts by dividing the facility or job shop into a number of workcenters. The method then proceeds to sequence one workcenter at a time. A disjunctive graph representation of the entire facility is used to capture interactions between workcenters. The introduction of different management objectives leads to different workcenter problems and different production scheduling algorithms. This paper presents algorithms for two different workcenter problems. Directions for future research are also discussed.