Random Dopant Fluctuation Effects on Double Gate Tunneling FET Performance

Research output: Contribution to conference › Conference Paper

Original language	English
Publication status	Published - Jan 2013
Event	10th International Workshop on Compact Modeling - Duration: 1 Jan 2013 → 1 Jan 2013

Conference	10th International Workshop on Compact Modeling
Period	1/01/13 → 1/01/13

Access to Document

@conference{8838494831a944f2a4c728145cc75090,

title = "Random Dopant Fluctuation Effects on Double Gate Tunneling FET Performance",

author = "Yu Cao and Hongyu He and Hao Wang and Yun Ye and Aixi Zhang and Ying Zhu and Mansun Chan and Jin He",

year = "2013",

month = jan,

language = "English",

note = "10th International Workshop on Compact Modeling ; Conference date: 01-01-2013 Through 01-01-2013",

}