Random parameter variation in analog VLSI neural networks for linear image filtering

B. E. Shi; T. Roska; L. O. Chua

Random parameter variation in analog VLSI neural networks for linear image filtering

B. E. Shi^*, T. Roska, L. O. Chua

^*Corresponding author for this work

Research output: Contribution to conference › Conference Paper › peer-review

1 Citation (Scopus)

Abstract

This paper introduces an analytic method to determine the sensitivity to random parameter variations of analog VLSI neural network architectures for linear image filtering. The authors compare the robustness of several different circuit architectures for low pass filtering. This method can also determine which components within a particular architecture should specified the most precisely.

Original language	English
Pages	1917-1922
Number of pages	6
Publication status	Published - 1994
Externally published	Yes
Event	Proceedings of the 1994 IEEE International Conference on Neural Networks. Part 1 (of 7) - Orlando, FL, USA Duration: 27 Jun 1994 → 29 Jun 1994

Conference

Conference	Proceedings of the 1994 IEEE International Conference on Neural Networks. Part 1 (of 7)
City	Orlando, FL, USA
Period	27/06/94 → 29/06/94

Cite this

@conference{8c378fc4f7d44286841465f42e7c2c36,

title = "Random parameter variation in analog VLSI neural networks for linear image filtering",

abstract = "This paper introduces an analytic method to determine the sensitivity to random parameter variations of analog VLSI neural network architectures for linear image filtering. The authors compare the robustness of several different circuit architectures for low pass filtering. This method can also determine which components within a particular architecture should specified the most precisely.",

author = "Shi, \{B. E.\} and T. Roska and Chua, \{L. O.\}",

year = "1994",

language = "English",

pages = "1917--1922",

note = "Proceedings of the 1994 IEEE International Conference on Neural Networks. Part 1 (of 7) ; Conference date: 27-06-1994 Through 29-06-1994",

}

TY - CONF

T1 - Random parameter variation in analog VLSI neural networks for linear image filtering

AU - Shi, B. E.

AU - Roska, T.

AU - Chua, L. O.

PY - 1994

Y1 - 1994

N2 - This paper introduces an analytic method to determine the sensitivity to random parameter variations of analog VLSI neural network architectures for linear image filtering. The authors compare the robustness of several different circuit architectures for low pass filtering. This method can also determine which components within a particular architecture should specified the most precisely.

AB - This paper introduces an analytic method to determine the sensitivity to random parameter variations of analog VLSI neural network architectures for linear image filtering. The authors compare the robustness of several different circuit architectures for low pass filtering. This method can also determine which components within a particular architecture should specified the most precisely.

UR - https://www.scopus.com/pages/publications/0028744429

M3 - Conference Paper

AN - SCOPUS:0028744429

SP - 1917

EP - 1922

T2 - Proceedings of the 1994 IEEE International Conference on Neural Networks. Part 1 (of 7)

Y2 - 27 June 1994 through 29 June 1994

ER -

Random parameter variation in analog VLSI neural networks for linear image filtering

Abstract

Conference

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