Recent progress in GaN-on-Si HEMT

Kevin J. Chen, Shu Yang

Research output: Chapter in Book/Conference Proceeding/ReportBook Chapterpeer-review

Abstract

With the benefits of low-loss conduction, high-frequency switching, and high-temperature operation, wide bandgap GaN heterojunction power devices are attractive candidates for next-generation energy-efficient and compact power conversion systems [1-5] including household appliances, photovoltaic inverters, data centers, motor drives, and so on. Compared with mainstream Si power devices, GaN heterojunction power devices are capable of delivering substantially lower ON resistance (RON) for the same voltage rating [6]. Such superiority originates from the fundamental material properties including high breakdown strength of GaN (10 times higher than Si), and high density (∼1013cm−2) of two-dimensional electron gas (2DEG) with high electron mobility (∼2000 cm2/Vs) in GaN-based heterostructures. Lower RONleads to reduced conduction loss and higher power conversion efficiency, while high switching frequency brings the benefit of smaller passives and compact systems. Both the higher conversion efficiency and high-temperature operating capability result in reduced burden of thermal management, and enable simpler/low-cost cooling solutions.

Original languageEnglish
Title of host publicationHandbook of GaN Semiconductor Materials and Devices
PublisherCRC Press
Pages347-366
Number of pages20
ISBN (Electronic)9781498747141
ISBN (Print)9781498747134
DOIs
Publication statusPublished - 1 Jan 2017

Bibliographical note

Publisher Copyright:
© 2018 by Taylor & Francis Group, LLC.

Fingerprint

Dive into the research topics of 'Recent progress in GaN-on-Si HEMT'. Together they form a unique fingerprint.

Cite this