Reduction of vacancy defects induced by thermal annealing in β-Ga2O3 epilayer

Teng Fan, Ning Tang*, Jiaqi Wei, Shixiong Zhang, Zhenhao Sun, Guoping Li, Jiayang Jiang, Lei Fu, Yunfan Zhang, Ye Yuan, Xin Rong*, Weikun Ge, Xinqiang Wang, Bo Shen*

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

Abstract

The effects of annealing in oxygen atmosphere of β-Ga2O3 epilayers were investigated by X-ray photoelectron spectroscopy, photoluminescence and Fourier-transform infrared spectroscopy. The increasing proportions of Ga3+ and OL (lattice oxygen) signifies the reduction of VO as the annealing temperature rising. The variations of the photoluminescence emissions demonstrate the improvement of the crystal quality and reduction of VO(1), VO(2) and VGa. VO and VGa are filled with oxygen atoms and gallium atoms after annealing, mainly attributed to the bonds constructions of Ga (1)–O (1) and Ga (1)–O (2) in GaO4 tetrahedra. These results offer detailed information and guidelines for removing intrinsic point defects in β-Ga2O3.

Original languageEnglish
Article number207525
JournalMicro and Nanostructures
Volume176
DOIs
Publication statusPublished - Apr 2023
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2023 Elsevier Ltd

Keywords

  • GaO tetrahedra
  • Thermal annealing
  • Vacancy defects
  • β-GaO

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