Abstract
Batch Normalization (BatchNorm) has become the default component in modern neural networks to stabilize training. In BatchNorm, centering and scaling operations, along with mean and variance statistics, are utilized for feature standardization over the batch dimension. The batch dependency of BatchNorm enables stable training and better representation of the network, while inevitably ignores the representation differences among instances. We propose to add a simple yet effective feature calibration scheme into the centering and scaling operations of BatchNorm, enhancing the instance-specific representations with the negligible computational cost. The centering calibration strengthens informative features and reduces noisy features. The scaling calibration restricts the feature intensity to form a more stable feature distribution. Our proposed variant of BatchNorm, namely Representative BatchNorm, can be plugged into existing methods to boost the performance of various tasks such as classification, detection, and segmentation. The source code is available in http://mmcheng.net/rbn.
| Original language | English |
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| Title of host publication | Proceedings - 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2021 |
| Publisher | IEEE Computer Society |
| Pages | 8665-8675 |
| Number of pages | 11 |
| ISBN (Electronic) | 9781665445092 |
| DOIs | |
| Publication status | Published - 2021 |
| Externally published | Yes |
| Event | 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2021 - Virtual, Online, United States Duration: 19 Jun 2021 → 25 Jun 2021 |
Publication series
| Name | Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition |
|---|---|
| ISSN (Print) | 1063-6919 |
Conference
| Conference | 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2021 |
|---|---|
| Country/Territory | United States |
| City | Virtual, Online |
| Period | 19/06/21 → 25/06/21 |
Bibliographical note
Publisher Copyright:© 2021 IEEE.