Robust Single Image Reflection Removal Against Adversarial Attacks

Zhenbo Song, Zhenyuan Zhang, Kaihao Zhang, Wenhan Luo*, Zhaoxin Fan, Wenqi Ren, Jianfeng Lu

*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

29 Citations (Scopus)

Abstract

This paper addresses the problem of robust deep single-image reflection removal (SIRR) against adversarial attacks. Current deep learning based SIRR methods have shown significant performance degradation due to unnoticeable distortions and perturbations on input images. For a comprehensive robustness study, we first conduct diverse adversarial attacks specifically for the SIRR problem, i.e. towards different attacking targets and regions. Then we propose a robust SIRR model, which integrates the cross-scale attention module, the multi-scale fusion module, and the adversarial image discriminator. By exploiting the multi-scale mechanism, the model narrows the gap between features from clean and adversarial images. The image discriminator adaptively distinguishes clean or noisy inputs, and thus further gains reliable robustness. Extensive experiments on Nature, SIR2, and Real datasets demonstrate that our model remarkably improves the robustness of SIRR across disparate scenes.

Original languageEnglish
Title of host publicationProceedings - 2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023
PublisherIEEE Computer Society
Pages24688-24698
Number of pages11
ISBN (Electronic)9798350301298
DOIs
Publication statusPublished - 2023
Externally publishedYes
Event2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023 - Vancouver, Canada
Duration: 18 Jun 202322 Jun 2023

Publication series

NameProceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Volume2023-June
ISSN (Print)1063-6919

Conference

Conference2023 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR 2023
Country/TerritoryCanada
CityVancouver
Period18/06/2322/06/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

  • Low-level vision

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