TY - GEN
T1 - Rotated wedge averaging method for junction characterization
AU - Yu, Weichuan
AU - Daniilidis, Kostas
AU - Sommer, Gerald
PY - 1998
Y1 - 1998
N2 - The computational cost of conventional filter methods for junction characterization is very high. This burden can be attenuated by using steerable filters. However, in order to achieve a high orientational selectivity to characterize complex junctions a large number of basis filters is necessary. From this results a yet too high computational effort for steerable filters. In this paper we present a new method for characterizing junctions which keeps the high orientational resolution and is computationally efficient. It is based on applying rotated copies of a wedge averaging filter and estimating the derivative with respect to the polar angle. The new method is compared with the steerable wedge filter method [13] in experiments with real images. We show the superiority of our method as well as its adaptability to scale changes and robustness against noise.
AB - The computational cost of conventional filter methods for junction characterization is very high. This burden can be attenuated by using steerable filters. However, in order to achieve a high orientational selectivity to characterize complex junctions a large number of basis filters is necessary. From this results a yet too high computational effort for steerable filters. In this paper we present a new method for characterizing junctions which keeps the high orientational resolution and is computationally efficient. It is based on applying rotated copies of a wedge averaging filter and estimating the derivative with respect to the polar angle. The new method is compared with the steerable wedge filter method [13] in experiments with real images. We show the superiority of our method as well as its adaptability to scale changes and robustness against noise.
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000074947400056
UR - https://openalex.org/W2117003028
UR - https://www.scopus.com/pages/publications/0032293149
U2 - 10.1109/CVPR.1998.698635
DO - 10.1109/CVPR.1998.698635
M3 - Conference Paper published in a book
SN - 0818684976
T3 - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
SP - 390
EP - 395
BT - Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
T2 - Proceedings of the 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Y2 - 23 June 1998 through 25 June 1998
ER -