TY - GEN
T1 - SEAT-LA
T2 - 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
AU - Rajaraman, R.
AU - Kim, J. S.
AU - Vijaykrishnan, N.
AU - Xie, Y.
AU - Irwin, M. J.
PY - 2006
Y1 - 2006
N2 - Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to develop techniques to quickly and accurately predict soft error rates (SER) in logic circuits. In this paper, we propose a new approach, which can be applied to designs that use cell libraries characterized for soft error analysis and utilizes analytical equations to model the propagation of a voltage pulse to the input of a state element. The average error of the SER estimates using our approach compared to the estimates obtained using circuit level simulations is 6.5% while providing an average speed up of 15000. We have demonstrated the scalability of our approach using designs from the ISCAS-85 benchmarks.
AB - Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to develop techniques to quickly and accurately predict soft error rates (SER) in logic circuits. In this paper, we propose a new approach, which can be applied to designs that use cell libraries characterized for soft error analysis and utilizes analytical equations to model the propagation of a voltage pulse to the input of a state element. The average error of the SER estimates using our approach compared to the estimates obtained using circuit level simulations is 6.5% while providing an average speed up of 15000. We have demonstrated the scalability of our approach using designs from the ISCAS-85 benchmarks.
UR - https://openalex.org/W2149041233
UR - https://www.scopus.com/pages/publications/33748538027
U2 - 10.1109/VLSID.2006.143
DO - 10.1109/VLSID.2006.143
M3 - Conference Paper published in a book
SN - 0769525024
SN - 9780769525020
T3 - Proceedings of the IEEE International Conference on VLSI Design
SP - 499
EP - 502
BT - Proceedings - 19th International Conference on VLSI Design held jointly with 5th International Conference on Embedded Systems Design
Y2 - 3 January 2006 through 7 January 2006
ER -