Self-aligned top-gate zinc oxide thin film transistors fabricated by reactive sputtering of metallic zinc target

Meng Zhang, Zhihe Xia, Wei Zhou, Rongsheng Chen, Man Wong, Hoi Sing Kwok

Research output: Contribution to journalConference article published in journalpeer-review

1 Citation (Scopus)

Abstract

Self-aligned top-gate zinc oxide (ZnO) thin film transistors (TFTs) was fabricated by reactive sputtering of metallic zinc target By optimizing deposition conditions, high-performance TFTs with a field effect mobility of 37.5 cm2/vs and an on/off ratio of 3.8∗108 was obtained.

Original languageEnglish
Pages (from-to)1173-1175
Number of pages3
JournalDigest of Technical Papers - SID International Symposium
Volume46
Issue numberBook 3
DOIs
Publication statusPublished - 1 Jun 2015
Event2015 SID International Symposium - San Jose, United States
Duration: 2 Jun 20153 Jun 2015

Bibliographical note

Publisher Copyright:
© 2015 SID.

Keywords

  • Metal target
  • Self-align
  • Thin film transistors
  • Zinc oxide

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