Abstract
Self-aligned top-gate zinc oxide (ZnO) thin film transistors (TFTs) was fabricated by reactive sputtering of metallic zinc target By optimizing deposition conditions, high-performance TFTs with a field effect mobility of 37.5 cm2/vs and an on/off ratio of 3.8∗108 was obtained.
| Original language | English |
|---|---|
| Pages (from-to) | 1173-1175 |
| Number of pages | 3 |
| Journal | Digest of Technical Papers - SID International Symposium |
| Volume | 46 |
| Issue number | Book 3 |
| DOIs | |
| Publication status | Published - 1 Jun 2015 |
| Event | 2015 SID International Symposium - San Jose, United States Duration: 2 Jun 2015 → 3 Jun 2015 |
Bibliographical note
Publisher Copyright:© 2015 SID.
Keywords
- Metal target
- Self-align
- Thin film transistors
- Zinc oxide