Abstract
GaN offers an excellent potential for fabricating X-ray detectors, taking advantage of its superior material properties and well-developed manufacturing technologies. In this letter, we demonstrated a self-powered fast-response X-ray detection using GaN-based vertical p-n diodes grown on a bulk GaN substrate. Attributed to the high crystalline quality achieved by homoepitaxy, the fabricated photodiodes exhibited an excellent rectification behavior, and therefore, a strong photovoltaic response to X-ray illumination when biased at 0 V. The transient X-ray detection analysis revealed that the self-powered detectors have a relatively short response time (<20 ms) and a good linear response to the X-ray incident dose rate with a high specific sensitivity of 170 nC·Gy-1·cm-2.
| Original language | English |
|---|---|
| Article number | 8705386 |
| Pages (from-to) | 1044-1047 |
| Number of pages | 4 |
| Journal | IEEE Electron Device Letters |
| Volume | 40 |
| Issue number | 7 |
| DOIs | |
| Publication status | Published - Jul 2019 |
Bibliographical note
Publisher Copyright:© 1980-2012 IEEE.
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
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SDG 9 Industry, Innovation, and Infrastructure
Keywords
- GaN
- X-ray detectors
- p-n diode
- self-powered
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