Self-testing second-order delta-sigma modulators using digital stimulus

Chee Kian Ong; Kwang Ting Cheng

doi:10.1109/VTS.2002.1011122

Self-testing second-order delta-sigma modulators using digital stimulus

Chee Kian Ong, Kwang Ting Cheng

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

13 Citations (Scopus)

Abstract

Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator, which incorporates simple design-for-testability circuitry. This technique requires only digital stimulus to test the modulator. Hence, it is suitable as an analog signature analyzer used in built-in self-test applications. Simulation results show that this technique is capable of accurately determining the performance of a second-order delta-sigma modulator ADC.

Original language	English
Title of host publication	Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002
Publisher	IEEE Computer Society
Pages	123-128
Number of pages	6
ISBN (Electronic)	0769515703
DOIs	https://doi.org/10.1109/VTS.2002.1011122
Publication status	Published - 2002
Externally published	Yes
Event	20th IEEE VLSI Test Symposium, VTS 2002 - Monterey, United States Duration: 28 Apr 2002 → 2 May 2002

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium
Volume	2002-January

Conference

Conference	20th IEEE VLSI Test Symposium, VTS 2002
Country/Territory	United States
City	Monterey
Period	28/04/02 → 2/05/02

Bibliographical note

Publisher Copyright:
© 2002 IEEE.

Keywords

Analog-digital conversion
Built-in self-test
Circuit testing
Delta modulation
Delta-sigma modulation
Digital filters
Digital modulation
Robustness
Signal generators
Signal resolution

Access to Document

10.1109/VTS.2002.1011122

Cite this

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title = "Self-testing second-order delta-sigma modulators using digital stimulus",

abstract = "Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator, which incorporates simple design-for-testability circuitry. This technique requires only digital stimulus to test the modulator. Hence, it is suitable as an analog signature analyzer used in built-in self-test applications. Simulation results show that this technique is capable of accurately determining the performance of a second-order delta-sigma modulator ADC.",

keywords = "Analog-digital conversion, Built-in self-test, Circuit testing, Delta modulation, Delta-sigma modulation, Digital filters, Digital modulation, Robustness, Signal generators, Signal resolution",

author = "Ong, \{Chee Kian\} and Cheng, \{Kwang Ting\}",

note = "Publisher Copyright: {\textcopyright} 2002 IEEE.; 20th IEEE VLSI Test Symposium, VTS 2002 ; Conference date: 28-04-2002 Through 02-05-2002",

year = "2002",

doi = "10.1109/VTS.2002.1011122",

language = "English",

series = "Proceedings of the IEEE VLSI Test Symposium",

publisher = "IEEE Computer Society",

pages = "123--128",

booktitle = "Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002",

}

Ong, CK & Cheng, KT 2002, Self-testing second-order delta-sigma modulators using digital stimulus. in Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002., 1011122, Proceedings of the IEEE VLSI Test Symposium, vol. 2002-January, IEEE Computer Society, pp. 123-128, 20th IEEE VLSI Test Symposium, VTS 2002, Monterey, United States, 28/04/02. https://doi.org/10.1109/VTS.2002.1011122

Self-testing second-order delta-sigma modulators using digital stimulus. / Ong, Chee Kian; Cheng, Kwang Ting.
Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002. IEEE Computer Society, 2002. p. 123-128 1011122 (Proceedings of the IEEE VLSI Test Symposium; Vol. 2002-January).

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

TY - GEN

T1 - Self-testing second-order delta-sigma modulators using digital stimulus

AU - Ong, Chee Kian

AU - Cheng, Kwang Ting

PY - 2002

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N2 - Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator, which incorporates simple design-for-testability circuitry. This technique requires only digital stimulus to test the modulator. Hence, it is suitable as an analog signature analyzer used in built-in self-test applications. Simulation results show that this technique is capable of accurately determining the performance of a second-order delta-sigma modulator ADC.

AB - Single-bit second-order delta-sigma modulators are commonly used in high-resolution ADCs. Testing this type of modulator requires a high-resolution test stimulus, which is difficult to generate. This paper proposes a novel and robust technique to determine the performance of the modulator, which incorporates simple design-for-testability circuitry. This technique requires only digital stimulus to test the modulator. Hence, it is suitable as an analog signature analyzer used in built-in self-test applications. Simulation results show that this technique is capable of accurately determining the performance of a second-order delta-sigma modulator ADC.

KW - Analog-digital conversion

KW - Built-in self-test

KW - Circuit testing

KW - Delta modulation

KW - Delta-sigma modulation

KW - Digital filters

KW - Digital modulation

KW - Robustness

KW - Signal generators

KW - Signal resolution

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T3 - Proceedings of the IEEE VLSI Test Symposium

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BT - Proceedings - 20th IEEE VLSI Test Symposium, VTS 2002

PB - IEEE Computer Society

T2 - 20th IEEE VLSI Test Symposium, VTS 2002

Y2 - 28 April 2002 through 2 May 2002

ER -

Self-testing second-order delta-sigma modulators using digital stimulus

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Bibliographical note

Keywords

Access to Document

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