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Semimetal-to-semiconductor transition in bismuth thin films

  • C. A. Hoffman*
  • , J. R. Meyer
  • , F. J. Bartoli
  • , A. Di Venere
  • , X. J. Yi
  • , C. L. Hou
  • , H. C. Wang
  • , J. B. Ketterson
  • , G. K. Wong
  • *Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

Abstract

Field- and temperature-dependent magnetotransport measurements on Bi layers grown by molecular-beam epitaxy have been analyzed by mixed-conduction techniques. In the thin-film limit, the net hole density scales inversely with layer thickness while the mobility scales linearly. By studying the minority electron concentration as a function of temperature in the range 100-300 K, we have unambiguously confirmed the long-standing theoretical prediction that quantum confinement should convert Bi from a semimetal to a semiconductor at a critical thickness on the order of 300.

Original languageEnglish
Pages (from-to)11431-11434
Number of pages4
JournalPhysical Review B-Condensed Matter
Volume48
Issue number15
DOIs
Publication statusPublished - 1993
Externally publishedYes

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