Signal-specialized parametrization

Pedro V. Sander*, Steven J. Gortler, John Snyder, Hugues Hoppe

*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

141 Citations (Scopus)

Abstract

To reduce memory requirements for texture mapping a model, we build a surface parametrization specialized to its signal (such as color or normal). Intuitively, we want to allocate more texture samples in regions with greater signal detail. Our approach is to minimize signal approximation error - the deference between the original surface signal and its reconstruction from the sampled texture. Specifically, our signal-stretch parametrization metric is derived from a Taylor expansion of signal error. For fast evaluation, this metric is pre-integrated over the surface as a metric tensor. We minimize this nonlinear metric using a novel coarse-to-fine hierarchical solver, further accelerated with a fine-to-coarse propagation of the integrated metric tensor. Use of metric tensors permits anisotropic squashing of the parametrization along directions of low signal gradient. Texture area can often be reduced by a factor of 4 for a desired signal accuracy compared to non-specialized parametrizations.

Original languageEnglish
Title of host publicationEurographics Workshop on Rendering
EditorsS. Gibson, P. Debevec, S.N. Spencer
Pages87-98
Number of pages12
Publication statusPublished - 2002
Externally publishedYes
Event13th Eurographics Workshop on Rendering - Pisa, Italy
Duration: 26 Jun 200228 Jun 2002

Publication series

NameEurographics Workshop on Rendering

Conference

Conference13th Eurographics Workshop on Rendering
Country/TerritoryItaly
CityPisa
Period26/06/0228/06/02

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