TY - JOUR
T1 - Simulation of light emission from thin-film microcavities
AU - Neyts, Kristiaan A.
PY - 1998/4
Y1 - 1998/4
N2 - In light-emitting devices based on thin-film technology, light waves that are partially or totally reflected at interfaces between different materials interfere and influence the angular distribution of the emitted light. For an electrical dipole transition, the radiation pattern is equivalent to that of an electrical dipole antenna. New theoretical expressions are provided for the radiation, discriminating for polarization, emission angle, absorption, and transmission; and the numerical calculation of discrete modes, narrow modes, and evanescent waves near absorbing media is discussed.
AB - In light-emitting devices based on thin-film technology, light waves that are partially or totally reflected at interfaces between different materials interfere and influence the angular distribution of the emitted light. For an electrical dipole transition, the radiation pattern is equivalent to that of an electrical dipole antenna. New theoretical expressions are provided for the radiation, discriminating for polarization, emission angle, absorption, and transmission; and the numerical calculation of discrete modes, narrow modes, and evanescent waves near absorbing media is discussed.
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000072719100019
UR - https://openalex.org/W2133037649
UR - https://www.scopus.com/pages/publications/0001660396
U2 - 10.1364/JOSAA.15.000962
DO - 10.1364/JOSAA.15.000962
M3 - Journal Article
SN - 1084-7529
VL - 15
SP - 962
EP - 971
JO - Journal of the Optical Society of America A: Optics and Image Science, and Vision
JF - Journal of the Optical Society of America A: Optics and Image Science, and Vision
IS - 4
ER -