Soft X-ray absorption spectroscopy of the MgB2 boron K edge in an MgB2/Mg composite

D. A. Fischer*, A. R. Moodenbaugh, Qiang Li, G. D. Gu, Yimei Zhu, J. W. Davenport, D. O. Welch, Haibin Su

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

2 Citations (Scopus)

Abstract

Soft X-ray absorption spectroscopy (XAS), using fluorescence yield, was used to study the boron K near edge in MgB2 superconductor. The sample consists of MgB2 crystallites randomly oriented in a magnesium matrix. Abrasion of the sample surface in vacuum provides a surface relatively free of boron-containing impurities. The intrinsic boron K near edge spectrum of the sample at a temperature of 295 K is identified. This spectrum is then compared in detail with a spectrum calculated using the full potential linearized augmented plane wave method. Features predicted by the theory appear near the expected energies, with qualitative agreement regarding shape and intensity.

Original languageEnglish
Pages (from-to)1207-1216
Number of pages10
JournalModern Physics Letters B
Volume20
Issue number19
DOIs
Publication statusPublished - 20 Aug 2006
Externally publishedYes

Keywords

  • MgB
  • Soft X-ray absorption
  • Superconductor

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