Abstract
This paper gives a critical review on the applications of ToF SIMS in the areas of polymer additive characterization and in the study of polymer blends and interfaces. Polymer additives can readily be identified by ToF SIMS using their parent molecular ions or characteristic fragments. This analytical capability has been successfully applied to monitor the migration or segregation of additives during polymer processing. ToF SIMS is an ideal analytical tool for the study of polymer blends and interfaces because it is able to provide information on both surface composition and morphology. In combination with other analytical techniques such as AFM and XPS, ToF SIMS chemical imaging capability has opened up new horizons in the investigation of complex polymer blend systems. Finally the main advantages and limitations of ToF SIMS in these application areas are also discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 6570-6574 |
| Number of pages | 5 |
| Journal | Applied Surface Science |
| Volume | 252 |
| Issue number | 19 |
| DOIs | |
| Publication status | Published - 30 Jul 2006 |
Keywords
- Additives
- Interfaces
- Morphology
- Polymer blends
- Surface composition
- ToF SIMS
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