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Statistical modeling and design of a 16nm 9T SRAM cell considering post-synthesis removal of metallic carbon-nanotubes

  • Yanan Sun
  • , Weifeng He
  • , Zhigang Mao
  • , Hailong Jiao
  • , Volkan Kursun

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

Abstract

A robust SRAM cell that can tolerate metallic carbon nanotubes is presented in this paper. A statistical yield model of carbon nanotube transistors and memory circuits is developed considering spatial correlations. The yield of the proposed process-imperfections-aware SRAM array is increased by more than twenty-one thousand times as compared to an alternative design that assumes perfect carbon nanotubes in a 16nm technology.

Original languageEnglish
Title of host publicationICEIC 2019 - International Conference on Electronics, Information, and Communication
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9788995004449
DOIs
Publication statusPublished - 3 May 2019
Event18th International Conference on Electronics, Information, and Communication, ICEIC 2019 - Auckland, New Zealand
Duration: 22 Jan 201925 Jan 2019

Publication series

NameICEIC 2019 - International Conference on Electronics, Information, and Communication

Conference

Conference18th International Conference on Electronics, Information, and Communication, ICEIC 2019
Country/TerritoryNew Zealand
CityAuckland
Period22/01/1925/01/19

Bibliographical note

Publisher Copyright:
© 2019 Institute of Electronics and Information Engineers (IEIE).

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