Strong circular photogalvanic effect in ZnO epitaxial films

Q. Zhang*, X. Q. Wang, C. M. Yin, F. J. Xu, N. Tang, B. Shen, Y. H. Chen, K. Chang, W. K. Ge, Y. Ishitani, A. Yoshikawa

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

21 Citations (Scopus)

Abstract

We report a strong circular photogalvanic effect (CPGE) in ZnO epitaxial films under interband excitation. It is observed that CPGE current is as large as 100 nA/W in ZnO, which is about one order in magnitude higher than that in InN film while the CPGE currents in GaN films are not detectable. The possible reasons for the above observations are the strong spin orbit coupling in ZnO or the inversed valence band structure of ZnO.

Original languageEnglish
Article number041907
JournalApplied Physics Letters
Volume97
Issue number4
DOIs
Publication statusPublished - 26 Jul 2010
Externally publishedYes

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