Suppressing flash EEPROM erase leakage with negative gate bias and LDD erase junction

Hsing Jen Wann, Steve A. Parke, Ping K. Ko, Chenming Hu

Research output: Contribution to journal › Conference article published in journal › peer-review

Original language	English
Article number	760255
Pages (from-to)	81-82
Number of pages	2
Journal	Digest of Technical Papers - Symposium on VLSI Technology
DOIs	https://doi.org/10.1109/VLSIT.1993.760255
Publication status	Published - 1993
Externally published	Yes
Event	1993 13th Symposium on VLSI Technology, VLSIT 1993 - Kyoto, Japan Duration: 17 May 1993 → 19 May 1993

Access to Document

@article{1470301d79664a93a2a279344367a5ab,

title = "Suppressing flash EEPROM erase leakage with negative gate bias and LDD erase junction",

author = "Wann, \{Hsing Jen\} and Parke, \{Steve A.\} and Ko, \{Ping K.\} and Chenming Hu",

year = "1993",

doi = "10.1109/VLSIT.1993.760255",

language = "English",

pages = "81--82",

journal = "Digest of Technical Papers - Symposium on VLSI Technology",

issn = "0743-1562",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "1993 13th Symposium on VLSI Technology, VLSIT 1993 ; Conference date: 17-05-1993 Through 19-05-1993",

}

TY - JOUR

T1 - Suppressing flash EEPROM erase leakage with negative gate bias and LDD erase junction

AU - Wann, Hsing Jen

AU - Parke, Steve A.

AU - Ko, Ping K.

AU - Hu, Chenming

PY - 1993

Y1 - 1993

UR - https://www.scopus.com/pages/publications/84977898134

U2 - 10.1109/VLSIT.1993.760255

DO - 10.1109/VLSIT.1993.760255

M3 - Conference article published in journal

AN - SCOPUS:84977898134

SN - 0743-1562

SP - 81

EP - 82

JO - Digest of Technical Papers - Symposium on VLSI Technology

JF - Digest of Technical Papers - Symposium on VLSI Technology

M1 - 760255

T2 - 1993 13th Symposium on VLSI Technology, VLSIT 1993

Y2 - 17 May 1993 through 19 May 1993

ER -