Abstract
The dynamic reference method is implemented in BSIM4 to realize both continuity and symmetry under the source referencing MOSFET model framework. The method achieves accurate results at a much faster speed compared with other body-referencing and surface potential based approaches.
| Original language | English |
|---|---|
| Title of host publication | 60th Device Research Conference, DRC 2002 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 65-66 |
| Number of pages | 2 |
| ISBN (Electronic) | 0780373170 |
| DOIs | |
| Publication status | Published - 2002 |
| Externally published | Yes |
| Event | 60th Device Research Conference, DRC 2002 - Santa Barbara, United States Duration: 24 Jun 2002 → 26 Jun 2002 |
Publication series
| Name | Device Research Conference - Conference Digest, DRC |
|---|---|
| Volume | 2002-January |
| ISSN (Print) | 1548-3770 |
Conference
| Conference | 60th Device Research Conference, DRC 2002 |
|---|---|
| Country/Territory | United States |
| City | Santa Barbara |
| Period | 24/06/02 → 26/06/02 |
Bibliographical note
Publisher Copyright:© 2002 IEEE.
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This output contributes to the following UN Sustainable Development Goals (SDGs)
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Keywords
- Circuit simulation
- Circuit testing
- Equations
- Forward contracts
- MOS devices
- MOSFET circuits
- Mathematical model
- Resistors
- Virtual manufacturing
- Voltage
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