TY - GEN
T1 - Testable design for adaptive linear equalizer in high-speed serial links
AU - Lin, Mitchell
AU - Cheng, Kwang Ting
PY - 2006/10/1
Y1 - 2006/10/1
N2 - This paper describes a novel DfT solution to the adaptive linear equalizer in the receiver of a high-speed serial link. We first summarize various equalization architectures, adaptive algorithms, circuit implementations, and their variations to which the proposed solution can be applied. The solution addresses the observability problem of the equalizer and results in a testable design that can be easily characterized and cost-effectively tested in the production line. To validate the proposed method, we conducted experiments for examples with various injected faults, for which the conventional approach of examining the eye opening at the output of the equalizer results in poor fault coverage. Simulation results demonstrate that the proposed method has a significantly higher coverage for those hard-to-detect faults.
AB - This paper describes a novel DfT solution to the adaptive linear equalizer in the receiver of a high-speed serial link. We first summarize various equalization architectures, adaptive algorithms, circuit implementations, and their variations to which the proposed solution can be applied. The solution addresses the observability problem of the equalizer and results in a testable design that can be easily characterized and cost-effectively tested in the production line. To validate the proposed method, we conducted experiments for examples with various injected faults, for which the conventional approach of examining the eye opening at the output of the equalizer results in poor fault coverage. Simulation results demonstrate that the proposed method has a significantly higher coverage for those hard-to-detect faults.
UR - https://openalex.org/W2139633080
UR - https://www.scopus.com/pages/publications/39749174358
U2 - 10.1109/TEST.2006.297698
DO - 10.1109/TEST.2006.297698
M3 - Conference Paper published in a book
SN - 1424402921
SN - 9781424402922
T3 - Proceedings - International Test Conference
BT - 2006 IEEE International Test Conference, ITC
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2006 IEEE International Test Conference, ITC
Y2 - 22 October 2006 through 27 October 2006
ER -