Testable design for adaptive linear equalizer in high-speed serial links

Mitchell Lin*, Kwang Ting Cheng

*Corresponding author for this work

Research output: Chapter in Book/Conference Proceeding/ReportConference Paper published in a bookpeer-review

Abstract

This paper describes a novel DfT solution to the adaptive linear equalizer in the receiver of a high-speed serial link. We first summarize various equalization architectures, adaptive algorithms, circuit implementations, and their variations to which the proposed solution can be applied. The solution addresses the observability problem of the equalizer and results in a testable design that can be easily characterized and cost-effectively tested in the production line. To validate the proposed method, we conducted experiments for examples with various injected faults, for which the conventional approach of examining the eye opening at the output of the equalizer results in poor fault coverage. Simulation results demonstrate that the proposed method has a significantly higher coverage for those hard-to-detect faults.

Original languageEnglish
Title of host publication2006 IEEE International Test Conference, ITC
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)1424402921, 9781424402922
DOIs
Publication statusPublished - 1 Oct 2006
Externally publishedYes
Event2006 IEEE International Test Conference, ITC - Santa Clara, CA, United States
Duration: 22 Oct 200627 Oct 2006

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539

Conference

Conference2006 IEEE International Test Conference, ITC
Country/TerritoryUnited States
CitySanta Clara, CA
Period22/10/0627/10/06

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