The Charge-free Zone Model for Conductive Cracks in Dielectric and Peizoelectric Ceramics

Tong-Yi Zhang

Research output: Contribution to conferenceConference Paperpeer-review

Abstract

In the charge-free zone (CFZ) model, dielectric and piezoelectric ceramics are treated to be mechanically brittle and electrically ductile. For an electrically conductive crack under electrical and/or mechanical loading, various charge emission mechanisms may function jointly at the tip due to the high electric field concentration. Charge emission and charge trapping consume more work and thus lead to a high value of the electric toughness. The failure criterions derived from the CFZ model were verified by experimental results on poled and thermally depoled lead zirconate titanate ceramics.
Original languageEnglish
Publication statusPublished - 2004
EventIUTAM Symposium (GA.02-14), Mechanics and Reliability of Actuating Materials, -
Duration: 1 Jan 20041 Jan 2004

Conference

ConferenceIUTAM Symposium (GA.02-14), Mechanics and Reliability of Actuating Materials,
Period1/01/041/01/04

ISBNs

['1-4020-4130-6']

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