TY - GEN
T1 - The design and optimization of a 25kS/s 10bit micropower current S/H Cell for weak current bio-medical applications
AU - Tsang, Ka Leong
AU - Yuan, Jie
PY - 2008
Y1 - 2008
N2 - In this paper, a micropower current sample-and-hold front-end is designed for weak current bio-medical applications in a 0.35-μm standard CMOS process. The design reduces the distortion of the current-mode sample-and-hold stage by exploiting the exponential I-V relationship of weakly-inverted MOS transistors. The design and optimization process for the stage is introduced in the paper. With the optimized design, SPICE simulation shows that the sample-and-hold stage can achieve over 60dB SNDR at the sampling rate of 25kS/s, with the input signal at the Nyquist frequency of 12.4kHz. The input current range is 100nA. The power consumption of the stage is about 3.6μW.
AB - In this paper, a micropower current sample-and-hold front-end is designed for weak current bio-medical applications in a 0.35-μm standard CMOS process. The design reduces the distortion of the current-mode sample-and-hold stage by exploiting the exponential I-V relationship of weakly-inverted MOS transistors. The design and optimization process for the stage is introduced in the paper. With the optimized design, SPICE simulation shows that the sample-and-hold stage can achieve over 60dB SNDR at the sampling rate of 25kS/s, with the input signal at the Nyquist frequency of 12.4kHz. The input current range is 100nA. The power consumption of the stage is about 3.6μW.
UR - https://www.webofscience.com/wos/woscc/full-record/WOS:000254291500003
UR - https://openalex.org/W2046364348
UR - https://www.scopus.com/pages/publications/50649114670
U2 - 10.1109/DELTA.2008.121
DO - 10.1109/DELTA.2008.121
M3 - Conference Paper published in a book
SN - 0769531105
SN - 9780769531106
T3 - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
SP - 11
EP - 14
BT - Proceedings - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
T2 - 4th IEEE International Symposium on Electronic Design, Test and Applications, DELTA 2008
Y2 - 23 January 2008 through 25 January 2008
ER -