The impact of the AC current crowding effect on BJT RF noise modeling

Wai Kit Ricky LEE; Tsz Yin MAN; Philip K.T. Mok; P. K. Ko; Mansun Chan

doi:10.1109/EDSSC.2003.1283542

The impact of the AC current crowding effect on BJT RF noise modeling

Wai Kit Ricky LEE
, Tsz Yin MAN
, Philip K.T. Mok
, P. K. Ko
, Mansun Chan

Department of Electronic and Computer Engineering

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

1 Citation (Scopus)

Abstract

In this paper, an improved hybrid-π model with equivalent noise sources are proposed. Based on these models, a comparison with the results obtained with the conventional hybrid-π model is made.

Original language	English
Title of host publication	2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	327-330
Number of pages	4
ISBN (Electronic)	0780377494
DOIs	https://doi.org/10.1109/EDSSC.2003.1283542
Publication status	Published - 19 Apr 2004
Event	IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 - Tsimshatsui, Kowloon, Hong Kong Duration: 16 Dec 2003 → 18 Dec 2003

Publication series

Name	2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003

Conference

Conference	IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003
Country/Territory	Hong Kong
City	Tsimshatsui, Kowloon
Period	16/12/03 → 18/12/03

Bibliographical note

Publisher Copyright:
©2003 IEEE.

Access to Document

10.1109/EDSSC.2003.1283542

Cite this

LEE, W. K. R., MAN, T. Y., Mok, P. K. T., Ko, P. K., & Chan, M. (2004). The impact of the AC current crowding effect on BJT RF noise modeling. In 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 (pp. 327-330). Article 1283542 (2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EDSSC.2003.1283542

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title = "The impact of the AC current crowding effect on BJT RF noise modeling",

abstract = "In this paper, an improved hybrid-π model with equivalent noise sources are proposed. Based on these models, a comparison with the results obtained with the conventional hybrid-π model is made.",

author = "LEE, \{Wai Kit Ricky\} and MAN, \{Tsz Yin\} and Mok, \{Philip K.T.\} and Ko, \{P. K.\} and Mansun Chan",

note = "Publisher Copyright: {\textcopyright}2003 IEEE.; IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003 ; Conference date: 16-12-2003 Through 18-12-2003",

year = "2004",

month = apr,

day = "19",

doi = "10.1109/EDSSC.2003.1283542",

language = "English",

series = "2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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booktitle = "2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003",

}

LEE, WKR, MAN, TY, Mok, PKT, Ko, PK & Chan, M 2004, The impact of the AC current crowding effect on BJT RF noise modeling. in 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003., 1283542, 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003, Institute of Electrical and Electronics Engineers Inc., pp. 327-330, IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003, Tsimshatsui, Kowloon, Hong Kong, 16/12/03. https://doi.org/10.1109/EDSSC.2003.1283542

The impact of the AC current crowding effect on BJT RF noise modeling. / LEE, Wai Kit Ricky; MAN, Tsz Yin; Mok, Philip K.T. et al.
2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003. Institute of Electrical and Electronics Engineers Inc., 2004. p. 327-330 1283542 (2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003).

Research output: Chapter in Book/Conference Proceeding/Report › Conference Paper published in a book › peer-review

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AU - Ko, P. K.

AU - Chan, Mansun

PY - 2004/4/19

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N2 - In this paper, an improved hybrid-π model with equivalent noise sources are proposed. Based on these models, a comparison with the results obtained with the conventional hybrid-π model is made.

AB - In this paper, an improved hybrid-π model with equivalent noise sources are proposed. Based on these models, a comparison with the results obtained with the conventional hybrid-π model is made.

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U2 - 10.1109/EDSSC.2003.1283542

DO - 10.1109/EDSSC.2003.1283542

M3 - Conference Paper published in a book

T3 - 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003

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BT - 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003

PB - Institute of Electrical and Electronics Engineers Inc.

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Y2 - 16 December 2003 through 18 December 2003

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LEE WKR, MAN TY, Mok PKT, Ko PK, Chan M. The impact of the AC current crowding effect on BJT RF noise modeling. In 2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003. Institute of Electrical and Electronics Engineers Inc. 2004. p. 327-330. 1283542. (2003 IEEE Conference on Electron Devices and Solid-State Circuits, EDSSC 2003). doi: 10.1109/EDSSC.2003.1283542

The impact of the AC current crowding effect on BJT RF noise modeling

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