Skip to main navigation Skip to search Skip to main content

The jumping dielectric breakdown behavior induced by crack propagation in ferroelectric materials: A phase field study

  • Yong Zhang
  • , Jie Wang*
  • , Tong Yi Zhang
  • *Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

Abstract

Ferroelectric materials often experience fracture and dielectric breakdown under large mechanical and/or electrical loads. These two failure behaviors can affect each other and may lead to new phenomena. This study predicts a new type of jumping dielectric breakdown during crack propagation in ferroelectric materials using a phase field model involving multiple order parameters. The driving forces for the evolution of polarization, fracture, and dielectric breakdown were analysed based on the concept of configurational forces. The jumping dielectric breakdown was attributed to the competition between crack propagation and breakdown initiation at the moving crack tip. The breakdown pattern is related to the polarization domain structure and is significantly influenced by the applied electric field and crack boundary conditions. Furthermore, the jumping breakdown associated with possible mechanical degradation of the material can change the driving and resistance forces for crack propagation. This study introduces a novel dielectric breakdown behavior during crack propagation and provides new insights into the coupling failure of ferroelectric materials.

Original languageEnglish
Article number105088
JournalJournal of the Mechanics and Physics of Solids
Volume169
DOIs
Publication statusPublished - Dec 2022

Bibliographical note

Publisher Copyright:
© 2022 Elsevier Ltd

Keywords

  • Dielectric breakdown
  • Ferroelectrics
  • Fracture
  • Generalized configurational force
  • Phase field model

Fingerprint

Dive into the research topics of 'The jumping dielectric breakdown behavior induced by crack propagation in ferroelectric materials: A phase field study'. Together they form a unique fingerprint.

Cite this