Abstract
Although successful and profitable applications have proven themselves in several market segments, significant challenges in system-in-package design and test remain for broader adoption.
| Original language | English |
|---|---|
| Pages (from-to) | 181 |
| Number of pages | 1 |
| Journal | IEEE Design and Test of Computers |
| Volume | 23 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - May 2006 |
| Externally published | Yes |