The Origin of Electrically Active Centers in a Near‐Coincidence Σ9 Grain Boundary in Germanium

N. Wang*, P. J. Wilbrandt, P. Haasen

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

5 Citations (Scopus)

Abstract

The electronic defect states of a near‐coincidence Σ9 tilt grain boundary (GB) in germanium is characterized by means of deep level transient spectroscopy (DLTS). An energy level at (0.52 ± 0.02) eV below the conduction band of Ge is found for 1 × 1016 m−2 defect states. The structure of this boundary, which contains GB dislocations (b = 1/9 [221] a), is further studied by high resolution electron microscopy (HREM). The dislocations are found to have many jogs (3 × 1016 m−2) which create dangling bonds. This finding may represent experimental evidence that the dangling bonds are at the origin of the electrical activity of the GB in Σ9 bicrystal.

Original languageEnglish
Pages (from-to)347-358
Number of pages12
JournalPhysica Status Solidi (B) Basic Research
Volume166
Issue number2
DOIs
Publication statusPublished - 1 Aug 1991
Externally publishedYes

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