Abstract
The development of sample preparation for the determination of Si isotopic abundances ratios with gas-source mass-spectrometry is introduced. The single crystal silicon is converted to SiO2 based on alkaline solution digestion followed by cation-exchange column and calcinating at 850°C. After dissolving SiO2 with HF acid, H2SiF6 solution is obtained. BaSiF6 precipitation is formed by drop adding BaCl2 solution. Then BaSiF6 is decomposed to SiF4 and Si isotope ratios is measured by gas-source mass-spectrometry. By Optimizing the sample preparation procedure, high recovery SiF4 gas is obtained. The results indicate that the sample preparation method for the determination of Si isotopic abundances ratios has high repeatability and recovery, meeting the requirement for the accurate measurement of silicon molar mass.
| Original language | English |
|---|---|
| Pages (from-to) | 474-477 |
| Number of pages | 4 |
| Journal | Jiliang Xuebao/Acta Metrologica Sinica |
| Volume | 32 |
| Issue number | 5 |
| DOIs | |
| Publication status | Published - Sept 2011 |
| Externally published | Yes |
Keywords
- Gas isotope ratios mass spectrometer
- Metrology
- Molar mass
- Silicon isotopic abundances ratios
- Single crystal silicon
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