Thermoelectric and structural properties of Bi1-xTe1+x thin films on CdTe(111)

Yunki Kim; Sunglae Cho; Antonio DiVenere; George K. Wong; Jerry R. Meyer; John B. Ketterson

Thermoelectric and structural properties of Bi_1-xTe_1+x thin films on CdTe(111)

Yunki Kim^*, Sunglae Cho, Antonio DiVenere, George K. Wong, Jerry R. Meyer, John B. Ketterson

^*Corresponding author for this work

Research output: Contribution to journal › Conference article published in journal › peer-review

1 Citation (Scopus)

Abstract

Thin films of the hexagonal phase of Bi_1-xTe_1+x have been grown on CdTe(111) substrates using molecular beam epitaxy (MBE). Analysis of X-ray diffraction patterns (θ-2θ scans and rocking curves) of the films shows that their crystallinity depends upon the compositional deviation from stoichiometric BiTe. Measurements of the temperature-dependent thermoelectric power (TEP) of the films reveals that compositional changes cause the TEP to vary from electron dominant (n-type) to hole dominant (p-type), implying their possible application as a thermoelectric cooler or power generator. Measurements of the temperature-dependent resistivity of the films were conducted, and the analysis shows semimetallic behavior. These results demonstrate that Bi_1-xTe_1+x is an appropriate model system to study the dependencies of thermoelectric and structural properties on binary composition.

Original language	English
Pages (from-to)	177-181
Number of pages	5
Journal	Materials Research Society Symposium - Proceedings
Volume	545
Publication status	Published - 1999
Externally published	Yes
Event	Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' - Boston, MA, USA Duration: 30 Nov 1998 → 3 Dec 1998

Cite this

@article{7653e6af047b483ca8a52a3318bd7abb,

title = "Thermoelectric and structural properties of Bi1-xTe1+x thin films on CdTe(111)",

abstract = "Thin films of the hexagonal phase of Bi1-xTe1+x have been grown on CdTe(111) substrates using molecular beam epitaxy (MBE). Analysis of X-ray diffraction patterns (θ-2θ scans and rocking curves) of the films shows that their crystallinity depends upon the compositional deviation from stoichiometric BiTe. Measurements of the temperature-dependent thermoelectric power (TEP) of the films reveals that compositional changes cause the TEP to vary from electron dominant (n-type) to hole dominant (p-type), implying their possible application as a thermoelectric cooler or power generator. Measurements of the temperature-dependent resistivity of the films were conducted, and the analysis shows semimetallic behavior. These results demonstrate that Bi1-xTe1+x is an appropriate model system to study the dependencies of thermoelectric and structural properties on binary composition.",

author = "Yunki Kim and Sunglae Cho and Antonio DiVenere and Wong, \{George K.\} and Meyer, \{Jerry R.\} and Ketterson, \{John B.\}",

year = "1999",

language = "English",

volume = "545",

pages = "177--181",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

publisher = "Materials Research Society",

note = "Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998' ; Conference date: 30-11-1998 Through 03-12-1998",

}

TY - JOUR

T1 - Thermoelectric and structural properties of Bi1-xTe1+x thin films on CdTe(111)

AU - Kim, Yunki

AU - Cho, Sunglae

AU - DiVenere, Antonio

AU - Wong, George K.

AU - Meyer, Jerry R.

AU - Ketterson, John B.

PY - 1999

Y1 - 1999

N2 - Thin films of the hexagonal phase of Bi1-xTe1+x have been grown on CdTe(111) substrates using molecular beam epitaxy (MBE). Analysis of X-ray diffraction patterns (θ-2θ scans and rocking curves) of the films shows that their crystallinity depends upon the compositional deviation from stoichiometric BiTe. Measurements of the temperature-dependent thermoelectric power (TEP) of the films reveals that compositional changes cause the TEP to vary from electron dominant (n-type) to hole dominant (p-type), implying their possible application as a thermoelectric cooler or power generator. Measurements of the temperature-dependent resistivity of the films were conducted, and the analysis shows semimetallic behavior. These results demonstrate that Bi1-xTe1+x is an appropriate model system to study the dependencies of thermoelectric and structural properties on binary composition.

AB - Thin films of the hexagonal phase of Bi1-xTe1+x have been grown on CdTe(111) substrates using molecular beam epitaxy (MBE). Analysis of X-ray diffraction patterns (θ-2θ scans and rocking curves) of the films shows that their crystallinity depends upon the compositional deviation from stoichiometric BiTe. Measurements of the temperature-dependent thermoelectric power (TEP) of the films reveals that compositional changes cause the TEP to vary from electron dominant (n-type) to hole dominant (p-type), implying their possible application as a thermoelectric cooler or power generator. Measurements of the temperature-dependent resistivity of the films were conducted, and the analysis shows semimetallic behavior. These results demonstrate that Bi1-xTe1+x is an appropriate model system to study the dependencies of thermoelectric and structural properties on binary composition.

UR - http://www.scopus.com/inward/record.url?scp=0032591227&partnerID=8YFLogxK

M3 - Conference article published in journal

AN - SCOPUS:0032591227

SN - 0272-9172

VL - 545

SP - 177

EP - 181

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1998 MRS Fall Meeting - The Symposium 'Advanced Catalytic Materials-1998'

Y2 - 30 November 1998 through 3 December 1998

ER -

Thermoelectric and structural properties of Bi_1-xTe_1+x thin films on CdTe(111)

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