Abstract
We have measured the thermoelectric power (TEP) of epitaxial Bi thin films and Bi/CdTe superlattices grown on CdTe substrates as a function of temperature in the range 20-300 K. We have observed that the TEP of a 10 000 Å Bi thin film is in good agreement with the bulk single crystal value and that the TEPs for superlattices with 400 Å and 800 Å Bi well thicknesses are enhanced over the bulk values. However, p-type doping effects in both thin films and superlattices lead to a positive TEP in samples with thinner quantum wells and a suppression of the magnitude in all cases. This suggests that the TEP may be enhanced further by altering the growth conditions to reduce the excess hole concentration.
| Original language | English |
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| Pages (from-to) | 673-676 |
| Number of pages | 4 |
| Journal | Solid State Communications |
| Volume | 102 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - Jun 1997 |
| Externally published | Yes |