TY - GEN
T1 - Towards data reliable crossbar-based memristive memories
AU - Ghofrani, Amirali
AU - Lastras-Montano, Miguel Angel
AU - Cheng, Kwang Ting
PY - 2013
Y1 - 2013
N2 - A series of breakthroughs in memristive devices have demonstrated the potential of using crossbar-based memristor arrays as ultra-high-density and low-power memory. However, their unique device characteristics could cause data disturbance for both read and write operations resulting in serious data reliability problems. This paper discusses such reliability issues in detail and proposes a comprehensive yet low area-/performance-/energy-overhead solution addressing these problems. The proposed solution applies asymmetric voltages for disturbance confinement, inserts redundancy for disturbance detection, and employs a refreshing mechanism to restore weakened data. The results of a case study show that the average overheads of area, performance and energy consumption for achieving data reliability, over a baseline unreliable memory system, are 3%, 4%, and 19% respectively.
AB - A series of breakthroughs in memristive devices have demonstrated the potential of using crossbar-based memristor arrays as ultra-high-density and low-power memory. However, their unique device characteristics could cause data disturbance for both read and write operations resulting in serious data reliability problems. This paper discusses such reliability issues in detail and proposes a comprehensive yet low area-/performance-/energy-overhead solution addressing these problems. The proposed solution applies asymmetric voltages for disturbance confinement, inserts redundancy for disturbance detection, and employs a refreshing mechanism to restore weakened data. The results of a case study show that the average overheads of area, performance and energy consumption for achieving data reliability, over a baseline unreliable memory system, are 3%, 4%, and 19% respectively.
KW - Crossbar
KW - Memristor
KW - Nonvolatile
KW - ReRAM
KW - Reliability
UR - https://openalex.org/W1965970229
UR - https://www.scopus.com/pages/publications/84891504474
U2 - 10.1109/TEST.2013.6651928
DO - 10.1109/TEST.2013.6651928
M3 - Conference Paper published in a book
SN - 9781479908592
T3 - Proceedings - International Test Conference
BT - Proceedings - 2013 IEEE International Test Conference, ITC 2013
T2 - 44th IEEE International Test Conference, ITC 2013
Y2 - 10 September 2013 through 12 September 2013
ER -