Ultrathin chromium oxide films on the W(100) surface

Donghui Guo, Qinlin Guo*, M. S. Altman, E. G. Wang

*Corresponding author for this work

Research output: Contribution to journalJournal Articlepeer-review

13 Citations (Scopus)

Abstract

Ultrathin chromium oxide films were prepared on a W(100) surface under ultrahigh-vacuum conditions and investigated in situ by X-ray photoelectron spectroscopy, ultraviolet photoelectron spectroscopy, and low-energy electron diffraction. The results show that, at Cr coverage of less than 1 monolayer, CrO2 is formed by oxidizing pre-deposited Cr at 300-320 K in ∼10-7 mbar oxygen. However, an increase of temperature causes formation of Cr2O3. At Cr coverage above 1 monolayer, only Cr2O3 is detected.

Original languageEnglish
Pages (from-to)20968-20972
Number of pages5
JournalJournal of Physical Chemistry B
Volume109
Issue number44
DOIs
Publication statusPublished - 10 Nov 2005

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