VIA-4 Avalanche-Induced Breakdown Mechanisms in Short-Channel MOSFETs

F. C. Hsu, P. K. Ko, S. Tam, C. Hu, R. S. Muller

Research output: Contribution to journal › Journal Article › peer-review

Original language	English
Pages (from-to)	1702-1703
Number of pages	2
Journal	IEEE Transactions on Electron Devices
Volume	29
Issue number	10
DOIs	https://doi.org/10.1109/T-ED.1982.20998
Publication status	Published - Oct 1982
Externally published	Yes

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title = "VIA-4 Avalanche-Induced Breakdown Mechanisms in Short-Channel MOSFETs",

author = "Hsu, \{F. C.\} and Ko, \{P. K.\} and S. Tam and C. Hu and Muller, \{R. S.\}",

year = "1982",

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T1 - VIA-4 Avalanche-Induced Breakdown Mechanisms in Short-Channel MOSFETs

AU - Hsu, F. C.

AU - Ko, P. K.

AU - Tam, S.

AU - Hu, C.

AU - Muller, R. S.

PY - 1982/10

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EP - 1703

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

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