Welcome message

^*Corresponding author for this work

Research output: Contribution to journal › Editorial

Original language	English
Article number	6401517
Journal	IEEE International Test Conference (TC)
DOIs	https://doi.org/10.1109/TEST.2012.6401517
Publication status	Published - 2012
Event	2012 International Test Conference, ITC 2012 - Anaheim, CA, United States Duration: 6 Nov 2012 → 8 Nov 2012

Access to Document

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title = "Welcome message",

author = "Douglas Young and Tim Cheng",

year = "2012",

doi = "10.1109/TEST.2012.6401517",

language = "English",

journal = "IEEE International Test Conference (TC)",

issn = "1089-3539",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

note = "2012 International Test Conference, ITC 2012 ; Conference date: 06-11-2012 Through 08-11-2012",

}

TY - JOUR

T1 - Welcome message

AU - Young, Douglas

AU - Cheng, Tim

PY - 2012

Y1 - 2012

UR - https://openalex.org/W4248410146

U2 - 10.1109/TEST.2012.6401517

DO - 10.1109/TEST.2012.6401517

M3 - Editorial

SN - 1089-3539

JO - IEEE International Test Conference (TC)

JF - IEEE International Test Conference (TC)

M1 - 6401517

T2 - 2012 International Test Conference, ITC 2012

Y2 - 6 November 2012 through 8 November 2012

ER -